Nucleation suppression by charge screening on grain boundaries: A kinetic model for bulk imprint in polycrystalline ferroelectric thin films
Fields of Study & Subjects
Nanofabrication and Lithography Techniques
Ferroelectric and Piezoelectric Materials
Metal and Thin Film Mechanics
Publication details
- Journal / source
- Physical Review Applied
- Publisher
- American Physical Society (APS)
- Volume
- 26
- Issue
- 2
- Publication date
- 28 July 2026
- Language
- EN