Mean weighted residuals reveal systematic overestimation of Bragg intensities in single-crystal diffraction
Abstract
The mean value of weighted residuals (〈ζ〉) was analysed for 8424 published single-crystal X-ray data sets of crystals containing only light elements (C, H, N, O). A striking asymmetry was observed: 71.5% of data sets exhibit positive 〈ζ〉 values, occurring 2.5 times more often than negative values. This imbalance suggests systematic errors, with evidence pointing to a slight overestimation of observed intensities ( I obs ). Simulations and theoretical analysis show that such overestimation artificially lowers common data-quality metrics, including the popular merging factor R merge , the redundancy independent factor R r.i.m. , the precision indicating factor R p.i.m. , the weighted agreement factor wR ( F 2 ) and even atomic displacement parameters, creating a `rewarding error' that may reinforce confirmation bias. Experimental data confirm these findings, as residual factors reach their minima for 〈ζ〉 > 0 rather than at zero. These results highlight the need for critical evaluation of data-processing strategies and caution against relying solely on conventional agreement factors as indicators of accuracy.
Fields of Study & Subjects
X-ray Diffraction in Crystallography
Crystallography and Radiation Phenomena
Radiation Shielding Materials Analysis
Publication details
- Journal / source
- Journal of Applied Crystallography
- Publisher
- International Union of Crystallography (IUCr)
- Volume
- 59
- Issue
- 3
- Pages
- 707–715
- Publication date
- 30 April 2026
- Language
- EN