High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8

Journal of Synchrotron Radiation 2026 Open access

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Authors: Hiroki Yamada, Seiya Shimono, Shogo Kawaguchi, Koji Ohara, Kei Watanabe, Michitaka Takemoto, Jo-Chi Tseng, Masakuni Takahashi, Yuki Sada, H Yamazaki, H Ohashi, Yasuhiko Imai
+8 more Takaki Hatsui, Ichiro Inoue, Shigeru Kimura, K. Sugimoto, Makina Yabashi, Osami Sakata, Yuji Higo, Kenji Tamasaku
DOI: 10.1107/s1600577525011294
Cited by: 5
References: 26

Abstract

X-ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high-throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring-8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2–27 Å −1 at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science.

Fields of Study & Subjects

X-ray Diffraction in Crystallography Radiation Shielding Materials Analysis X-ray Spectroscopy and Fluorescence Analysis

Publication details

Journal / source
Journal of Synchrotron Radiation
Publisher
International Union of Crystallography (IUCr)
Volume
33
Issue
2
Pages
516–522
Publication date
5 January 2026
Language
EN