X-ray fluorescence microscopy exposure estimates using a single excitation energy

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Authors: Benjamin Roter, Andrew M. Crawford, Thomas V. O’Halloran, Chris J. Jacobsen
Cited by: 1
References: 64

Abstract

Scanning fluorescence X-ray microscopy is widely used for quantitative mapping of elemental concentrations, including in studies of essential but low-concentration metals in cells, tissues, and organs. Practical studies often use a single incident photon energy to excite fluorescence from many elements. We present calculations of the number of incident photons per pixel required to detect a specified areal concentration of an element in the case of far-from-threshold excitation, along with the calculated radiation dose consequently imparted in a simple model tissue. We also show how certain approximations can lead to less accurate estimates. These calculations are not specific to one particular experiment, though we also provide a comparison with one experimental result. These results can be used to guide experimental planning for studies of the role of low-concentration elements in biological tissues.

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Advanced X-ray and CT Imaging X-ray Spectroscopy and Fluorescence Analysis

Publication details

Journal / source
Journal of Synchrotron Radiation
Publisher
International Union of Crystallography (IUCr)
Volume
33
Issue
4
Pages
1074–1084
Publication date
2 June 2026
Language
EN