3D atomic structure determination with ultrashort-pulse MeV electron diffraction

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Authors: V. Hennicke, Max Hachmann, Paul Benjamin Klar, Patrick Y. A. Reinke, Tim Pakendorf, Jan Meyer, Hossein Delsim‐Hashemi, Miriam Barthelmeß, Sreevidya Thekku Veedu, P. Fischer, Ana C. Rodrigues, Arlinda Qelaj
+18 more Alexandra Tolstikova, Oleksandr Yefanov, Juna Wernsmann, François Lémery, Robin Schubert, Iñaki de Diego, Stuart Hayes, Sebastian Günther, Sven Falke, Erik Fröjd, Aldo Mozzanica, Lukáš Palatinus, Kai Rossnagel, Bernd Schmitt, Henry N. Chapman, Wim P. Leemans, Klaus Flöttmann, Alke Meents
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Abstract

Understanding structure at the atomic scale is fundamental for understanding the functioning and the development of materials with improved properties. Compared with other probes providing atomic resolution, electrons offer the strongest interaction in combination with minimal radiation damage, which makes them an ideal tool for investigating very small and radiation-sensitive samples [Henderson (1995), Q. Rev. Biophys. 28 , 171–193]. However, these benefits are often offset by the laborious preparation of nanometre-sized samples that are not visible using a light microscope, and the fact that experiments are largely restricted to ultra-high vacuum [Duyvesteyn et al. (2018), Proc. Natl Acad. Sci. USA 115 , 9569–9573; Gruene et al. (2021), Nat. Rev. Chem. 5 , 660–668]. Here, we report the successful implementation of MeV electron diffraction for ab initio 3D structure determination of the quasi-2D material muscovite and the quantum material 1 T -TaS 2 at atomic resolution. By employing ultrashort electron pulses from the REGAE (Relativistic electron gun for atomic exploration) accelerator, we obtained high-quality diffraction datasets suitable for structural refinements based on dynamical scattering theory, enabling precise localization of even hydrogen atoms. The increased penetration depth of MeV electrons significantly expands the applicable thickness range of samples, overcoming previous restrictions associated with traditional electron diffraction. These findings establish MeV electron diffraction as a viable approach for investigating a broad range of materials, including nanostructures and radiation-sensitive compounds, and open up new opportunities for in situ and time-resolved experiments [Chao et al. (2023), Chem. Rev. 123 , 8347–8394; Filippetto et al. (2022), Rev. Mod. Phys. 94 , 045004].

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Crystallography and Radiation Phenomena Electron and X-Ray Spectroscopy Techniques

Publication details

Journal / source
IUCrJ
Volume
13
Issue
3
Pages
282–290
Publication date
30 March 2026
Language
EN