REFORGE: A Robust Ensemble for Image Forgery Detection and Localization in Social Network Images

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Authors: Yahya Al-Nabhani, Amirrudin Kamsin, M. A. Mohamed Nizam, Khalil Al Ruqeishi
Cited by: 2
References: 37

Abstract

Image forgery detection and localization are critical for verifying the authenticity of digital images. This paper presents REFORGE, an ensemble dual-branch deep network that combines a classification branch for detecting manipulated images and a segmentation branch for localizing tampered regions, enhanced with a reinforcement learning (RL) based refinement module. The classification branch identifies forged images with high precision, while the segmentation branch produces pixel-level tampering masks. A lightweight RL agent then iteratively improves the predicted mask, treating each pixel as an agent to maximize a reward for accurate localization. We integrate outputs from multiple state-of-the-art models in an ensemble fashion to boost generalization and robustness. Extensive experiments on standard benchmarks (CASIA v2 and augmented social-network degraded images) demonstrate that our method achieves near-perfect forgery detection (accuracy ∼98.9%, AUROC ∼0.997) and significantly improved localization on tampered images (mean IoU = 0.570, median = 0.644, Q1/Q3 = 0.323/0.852, IoU≥ 0.5: 63.35%, IoU≥ 0.75: 38.36%). We present ablation studies showing the contribution of each component (ensemble learning, dual-branch architecture, and RL refinement) to overall performance. The proposed approach outperforms baseline models and conventional post-processing (e.g. DenseCRF) in both detection and localization. Our work represents a novel integration of ensemble deep learning and reinforcement learning for image forensics, pushing the state-of-the-art in tampering localization accuracy and reliability.

Fields of Study & Subjects

Digital Media Forensic Detection Generative Adversarial Networks and Image Synthesis Advanced Image Processing Techniques

Publication details

Journal / source
IEEE Access
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
14
Pages
8773–8788
Publication date
1 January 2026