FAMF: Robust Feature-Level Adversarial Attack on Metric-Based Few-Shot Learning Models
Fields of Study & Subjects
Adversarial Robustness in Machine Learning
Domain Adaptation and Few-Shot Learning
Generative Adversarial Networks and Image Synthesis
Publication details
- Journal / source
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 14
- Pages
- 15110–15121
- Publication date
- 1 January 2026