FFCIL: Fine-Grained Few-Shot Class Incremental Learning With Destruction-Construction Learning for TFT-LCD Defect Classification

IEEE Access 2026 Open access

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Authors: Anindita Suryarasmi, Chia‐Yu Lin, Le-Chien Chu, Wei-Jen Wang, Deron Liang

DOI: 10.1109/access.2026.3661148

Cited by: 0

References: 24

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Domain Adaptation and Few-Shot Learning Advanced Neural Network Applications

References 24