Reliability Analysis Considering the PFC Function and Redundancy Effect of the Vienna Converter

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Authors: Yun Sik Jang, Sang Hyeok Lee, F.-S. Kang
Cited by: 1
References: 34

Fields of Study & Subjects

HVDC Systems and Fault Protection Silicon Carbide Semiconductor Technologies Microgrid Control and Optimization

Publication details

Journal / source
IEEE Access
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
14
Pages
21742–21752
Publication date
1 January 2026