Verification of Novel SAR Measurement System Utilizing Multi-Probe Planar Approach Inversion Algorithm

The certification of wireless devices necessitates rapid and precise Specific Absorption Rate (SAR) assessment, a critical yet challenging requirement in modern electromagnetic compatibility (EMC) testing. Conventional systems, dependent on sequential mechanical scanning, are fundamentally limited by low throughput and inherent probe-induced field distortions, creating a bottleneck for large-scale certification. This paper presents a novel multi-probe planar inversion system (0.6–6 GHz) designed to overcome these limitations. The core of this work is the development and integration of a dedicated 3D field inversion algorithm within a novel system framework to correct probe-induced errors. This algorithm uniquely integrates experimental and simulated data to correct systematic probe errors, enabling high-fidelity SAR reconstruction with a maximum deviation of less than 3% from the reference standard. Experimental validation demonstrates that the system reduces measurement time from several hours to just minutes. By simultaneously resolving the critical trade-off between speed and accuracy, this work provides a robust and efficient framework that is directly applicable to accelerating the EMC compliance pipeline for 5G, IoT, and next-generation wireless technologies.