An MCP Tool for Bug Localization by Leveraging Modification Frequencies of Similar Bug Reports
Abstract
During software maintenance, developers spend a considerable amount of time locating the source of bugs. Despite the advent of LLMs and vibe coding, accurately identifying the locations for bug fixes in large-scale codebases remains an unresolved challenge. In this paper, we propose a new bug localization approach that counts the modification frequencies of similar bug reports for identifying source locations that cause bugs. Given a new bug report, our approach extracts the similar bug reports that include completed bug fixes. Then, our approach counts the number of times that each method was modified in those similar reports. Finally, our approach identifies the methods that were frequently modified in those similar reports and recommends the methods to be fixed. We also implement the approach as an MCP tool that can be used in LLM-based development environments. We evaluated our approach against reimplemented versions of FineLocator as well as LLMs on seven open-source projects. Across all projects our approach increased Precision@10, Recall@10, MAP, and MRR by 2.12, 2.22, 2.50, and 2.71 times, respectively, over those of the state-of-the art approach FineLocator. When deployed as an MCP tool, MCP+LLM yields 0.52, 0.35, 0.36, and 0.34, compared to LLM-only at 0.17, 0.09, 0.11, and 0.10 across the same metrics. These gains hold for both Java and Python codebases, demonstrating that combining large-languagemodel semantics with modification-frequency evidence yields substantially more accurate and languageagnostic bug localization than conventional methods. Our implementation, datasets, and replication scripts are publicly released to foster future research and industrial adoption of high-precision method-level bug localization.
Fields of Study & Subjects
Software Engineering Research
Software Testing and Debugging Techniques
Software Engineering Techniques and Practices
Publication details
- Journal / source
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 14
- Pages
- 25242–25263
- Publication date
- 1 January 2026