The DiQuNET Ion-Transport IC of a Trapped-Ion Quantum Processor: A PoC
Abstract
[Background] The industrial usefulness of a quantum processor is correlated with its scalability; thus, one of the main focuses of current industrial and academic efforts is to upscale this machine. For trapped-ion quantum processors, some of the most promising scalable architectures require ion transport across surface-segmented traps. Published solutions for the control of ion transport have been mostly developed as bulky, rack-based embedded systems, placed at room temperature outside the vacuum/cryostat chambers, with cables fed in, and with voltages time-multiplexed or broadcast to reach the electrodes of the trap in order to apply the fixed pre-computed raw voltage sets for each fabricated ion trap, where the voltages are tailored to its time- and setup-dependent deposited impurities condition; all of which is neither scalable nor optimally efficient. [Objective] To address this gap, this study proposes a DiQuNET scalable integrated microelectronics solution for ion-transport control. [Methods]We describe the system-level integration strategy and a full engineering development cycle of the device. [Results] This work presents the conception (specification and design) of the ion-transport integrated circuit and the realization (implementation and evaluation) of a proof of concept (TRL 3), which also constitutes a proof of principle of the first DiQuNET compliant integrated circuit. [Conclusion] These results verify and validate the design of an efficient, architecture-scalable, trainable, automated, parametric, and re-configurable proof of concept of the ion-transport integrated circuit. These results support the feasibility, efficiency, and viability potential of the DiQuNET paradigm that uses a distributed set ofautomatamachines to control a quantum processor.
Fields of Study & Subjects
Quantum and electron transport phenomena
Quantum-Dot Cellular Automata
Quantum Computing Algorithms and Architecture
Publication details
- Journal / source
- IEEE Access
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 14
- Pages
- 35527–35551
- Publication date
- 1 January 2026
- Language
- EN