SimGroup-FS: Multi-Way Redundancy Modeling for Interpretable Feature Selection in Supervised Learning

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Authors: Mohammad Hossein Safarpour
Cited by: 1
References: 39

Abstract

Feature selection is a cornerstone of high-dimensional supervised learning, critically influencing model accuracy, computational efficiency, and interpretability. Conventional filter-based methods, however, predominantly rely on univariate relevance or pairwise redundancy measures, which are inherently limited in capturing complex, multi-way dependencies among three or more features. To address this gap, we propose SimGroup-FS, a graph-theoretic feature selection framework that explicitly models structural redundancy through connected component analysis. The method constructs a cosine-similarity graph over the feature set, applies a similarity threshold ϵ to define edges, and identifies redundancy groups as connected components. From each group, a single representative feature is selected based on its discriminative relevance to the target variable, using flexible metrics such as Spearman correlation, mutual information, or ANOVA F-values. Evaluated on six diverse UCI benchmark datasets—including hybrid and purely numerical types—SimGroup-FS achieves an average dimensionality reduction of 88.8%, with reductions exceeding 96% on datasets likewdbcandionosphere. Crucially, classification performance is consistently preserved or significantly enhanced across multiple classifiers (SVM, Random Forest, and k-NN). Most notably, on thewdbcdataset, the SVM F1-score improves from a near-failure level of 0.019 to a robust 0.887, demonstrating the method’s ability to mitigate noise-induced model degradation. SimGroup-FS operates inO(m2n)time, is model-agnostic, fully reproducible, and yields interpretable feature groupings.

Fields of Study & Subjects

Explainable Artificial Intelligence (XAI) Face and Expression Recognition Machine Learning and Data Classification

Publication details

Journal / source
IEEE Access
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
14
Pages
30327–30338
Publication date
1 January 2026