Demographic Variability of Face Image Quality Measures in Operational Data

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Authors: Sven Utcke, Sophia Kramp, Sebastian Engelhardt, Wassim Kabbani, Christian Rathgeb, Torsten Schlett, Johannes Merkle, Benjamin Tams, Jonas Dehen, Christoph Busch
Cited by: 1
References: 36

Abstract

Face image quality assessment plays a critical role in operational face recognition systems, where quality thresholds directly affect recognition performance, throughput, and fairness. This work presents a large-scale empirical analysis of demographic variability in the ISO/IEC 29794-5-compliant Open Source Face Image Quality (OFIQ) measures using real operational data from automated border control scenarios. The dataset comprises more than a hundred of thousand constrained reference images and corresponding live capture images acquired at border gates, enabling a realistic assessment of OFIQ behavior under deployment conditions. The unified quality score and multiple component quality measures are analysed across gender, age groups, skin tones and region-of-origin. The results reveal pronounced demographic variability in the unified quality score of OFIQ as well as several component quality measures, in particular the ones related to luminance, sharpness and contrast. It is further shown that this variability leads to substantial differences in percentile-based quality thresholds across demographic subgroups. Definitions of globally applicable thresholds is challenging for operators but suggestions are provided. In addition, we identify saturation effects caused by normative scalar mappings, limiting their discriminative power in operational settings. The study provides actionable insights for system operators and informs ongoing standardization and algorithmic efforts, including the development of OFIQ 2.0.

Fields of Study & Subjects

Face recognition and analysis Biometric Identification and Security Reliability and Agreement in Measurement

Publication details

Journal / source
IEEE Access
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
14
Pages
35154–35170
Publication date
1 January 2026
Language
EN