Design of Self-Checking Discrete Devices Based on Boolean Signals Correction and Composition of Constant-Weight Codes “1-Out-of-4” and “3-Out-of-4”

Read full text
Authors: Д.В. Ефанов, Yeseniya I. Yelina, Sunnatillo Boltayev, Nazirjan Aripov, Asadulla Rahimovich Azizov, Elnara Kuandikovna Ametova, Sokhibjamol I. Valiev
Cited by: 0
References: 39

Abstract

In the design of self-checking discrete devices, the main tasks are to achieve the smallest structural redundancy of the concurrent error-detection circuits and to ensure the checkability of all their components. Practice shows that it is not always possible to achieve this using traditional methods of designing concurrent error-detection circuits, based on duplication and control of calculations using code methods. The authors of the paper propose a method for modifying constant-weight codes, which allows achieving special properties of the designed structures of self-checking devices. In the course of our research, we used methods of discrete mathematics and technical diagnostics for the development and justification of new approaches to designing self-checking discrete devices. We have proposed methods for designing concurrent error-detection circuits based on Boolean signals correction and the composition of constant-weight codes “1-out-of-4” and “3-out-of-4”. These methods allow designing a large number of concurrent error-detection circuits, among which the most effective ones in terms of structural redundancy can be selected. In addition, by minimizing the number of signal correction elements in the concurrent error-detection circuit, the solution to the problem of ensuring complete self-checking of the concurrent error-detection circuit structures is simplified. Experimental results confirm the theoretical prerequisites for improving the methods of organizing concurrent error-detection circuits based on the methods proposed by the authors of the paper. Our proposed solutions can be effectively used in practice in the design of self-checking discrete devices based on any element base.

Fields of Study & Subjects

Radiation Effects in Electronics VLSI and Analog Circuit Testing Coding theory and cryptography

Publication details

Journal / source
IEEE Access
Volume
14
Pages
42924–42942
Publication date
1 January 2026
Language
EN