EMA-WIoU-YOLO11: Efficient Multi-Scale Attention and Geometry-Aware Regression for Public-Space Obstacle Detection

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Authors: Bocen Liu, Chunyang Fang, Yuang Zhang, 佟伟亚, Xi Zhang
Cited by: 1
References: 14

Abstract

Reliable detection of diverse obstacles in unstructured public spaces is critical for assistive navigation systems serving visually impaired individuals and autonomous platforms. Existing approaches face three key limitations: (1) vanilla single-scale attention mechanisms fail to discriminate visually similar obstacle pairs under varying illumination and occlusion; (2) standard IoU-based regression losses assign equal gradient weight to geometrically inferior proposals, degrading localisation in crowded scenes; (3) prior benchmark models are validated on narrow-category datasets that do not reflect the fine-grained 22-class diversity encountered in real-world urban environments. To address these challenges, we propose EMA-WIoU-YOLO11, an enhanced detection framework built upon the YOLO11n backbone. Our key innovations are threefold: (1) we embed an Efficient Multi-Scale Attention (EMA) module after the final C3k2 backbone stage to jointly capture global channel statistics and local spatial context with negligible parameter overhead; (2) we replace the standard box regression loss with the Wise-IoU (WIoU) formulation, which introduces a sample-wise focusing weight to suppress geometrically inferior anchors; (3) we provide the first systematic evaluation on the 22-class Dist-YOLO Public-Space Obstacle dataset comprising 3,350 annotated images. Experiments demonstrate that our model achieves mAP@0.5=0.849, precision=0.90, and recall=0.80, with peak F1=0.81 at a confidence threshold of 0.374, confirming the effectiveness and practical applicability of the proposed framework.

Fields of Study & Subjects

Advanced Neural Network Applications Robotics and Sensor-Based Localization Anomaly Detection Techniques and Applications

Publication details

Journal / source
2026 9th International Conference on Advanced Electronic Technology, Computers and Software Engineering (AETCSE)
Publisher
IEEE
Pages
744–747
Publication date
20 March 2026