Detection and Resolution of Low-Contrast Local Defects Using an Electromagnetic Jet Lens Applied to RF Shielding Materials

2026 107th ARFTG Microwave Measurement Conference (ARFTG) 2026

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Authors: Mathis Granger, Bernard Bayard, B. Sauviac
DOI: 10.1109/arftg68740.2026.11614642
Cited by: 1
References: 22

Publication details

Journal / source
2026 107th ARFTG Microwave Measurement Conference (ARFTG)
Publisher
IEEE
Pages
1–6
Publication date
1 June 2026