IR Drop-Aware ECO: A Fast Approach to Minimize Layout and Timing Disturbance

Ensuring power integrity in advanced IC design is increasingly challenging, as excessive IR drop can severely impact circuit performance and reliability, especially during the late-stage Engineering Change Order (ECO) process. In this work, we propose a novel IR drop-aware ECO framework that addresses IR drop violations through targeted cell displacement while minimizing timing and layout disruption. Our approach incorporates vertical IR drop mitigation and horizontal timing fix, and employs a rail severity scoring mechanism that combines current correlation and spatial proximity to evaluate IR drop severity. Experimental results on three post-routed benchmark designs demonstrate that our method achieves significant reductions in worst-case dynamic voltage drop for certain designs and mitigates local timing degradation. Additionally, the proposed severity score accurately reflects trends in IR drop risk, providing valuable guidance for ECO optimization.