FIawase: A SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation

Single-event transients (SETs) threaten modern reliability-demanding SoCs equipped with error correction codes (ECC) for single event upset (SEU) mitigation. However, conventional gate-level SET fault injection (FI) remains prohibitively slow for practical reliability evaluation. This work presents Flawase, a high-throughput SET injection framework that enables comprehensive system-level evaluation of SET-induced soft errors. Flawase consists of two phases: a netlist-level inject-and-capture simulation, which systematically flips the output of every gate-cycle pair during program execution to record flipflop changes one cycle later, and a scan-chain-based replay-andmeasure emulation, which replays these patterns at hardware speed to quantify system-level impact. Implemented on an opensource RISC-V system, FIawase reduces a comprehensive SET injection campaign from decades of pure simulation to nearly a day, achieving over four orders of magnitude end-to-end speedup. Flawase takes a critical first step toward exhaustive, cycle-accurate SET analysis, enabling architectural and reliability research at previously infeasible scales.