Harpocrates-in-Action: Using Simulation-Based Functional Test Programs to Catch Marginal Defects in CPUs

2026 56th Annual IEEE International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) 2026

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Authors: Nikos Karystinos, Odysseas Chatzopoulos, Dimitris Gizopoulos, Ashish Kumar, Sankar Gurumurthy, Sudhanva Gurumurthi, Vilas Sridharan
DOI: 10.1109/dsn-s70715.2026.00024
Cited by: 1
References: 28

Publication details

Journal / source
2026 56th Annual IEEE International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
Publisher
IEEE
Pages
57–63
Publication date
1 June 2026