ScaleDisturb: Exploiting Temporal Asymmetry to Amplify Read Disturbance in Modern DRAM Chips

2026 56th Annual IEEE International Conference on Dependable Systems and Networks (DSN) 2026 Open access

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Authors: Jikun Wang, Haocong Luo, Ataberk Olgun, İsmail Emir Yüksel, A. Giray Yağlıkçı, Yu Liang, F. Nisa Bostancı, Mohammad Sadrosadati, Onur Mutlu
DOI: 10.1109/dsn69566.2026.00023
Cited by: 1
References: 117

Fields of Study & Subjects

Low-power high-performance VLSI design Parallel Computing and Optimization Techniques Semiconductor materials and devices

Publication details

Journal / source
2026 56th Annual IEEE International Conference on Dependable Systems and Networks (DSN)
Publisher
IEEE
Pages
81–95
Publication date
22 June 2026
Language
EN