A Retrieval-Augmented Log-Metric-Trace Twin for Backend Failure Diagnosis

2026 10th International Conference on Electronic Information Technology and Computer Engineering (EITCE) 2026

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Authors: Zhiyang Liu, Kejia Wu, Siyuan Dang, Yi Yang
DOI: 10.1109/eitce70137.2026.11634314
Cited by: 4
References: 20

Publication details

Journal / source
2026 10th International Conference on Electronic Information Technology and Computer Engineering (EITCE)
Publisher
IEEE
Pages
751–756
Publication date
1 June 2026