How well LLM-based test generation techniques perform with newer LLM versions?

2026 IEEE International Conference on Software Testing, Verification and Validation (ICST) 2026

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Authors: Michael Konstantinou, Renzo Degiovanni, Mike Papadakis
DOI: 10.1109/icst69053.2026.00040
Cited by: 1
References: 19

Publication details

Journal / source
2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)
Publisher
IEEE
Pages
233–243
Publication date
18 May 2026