Interpretable GNNs for Fault Detection in Circuits

2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

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Authors: Rupesh Raj Karn, Johann Knechtel, Ozgur Sinanoglu
DOI: 10.1109/iolts69666.2026.11633627
Cited by: 1
References: 41

Publication details

Journal / source
2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Publisher
IEEE
Pages
1–5
Publication date
1 July 2026