Second-Order Asymptotics of Two-Sample Tests
Abstract
In two-sampling testing, one observes two independent sequences of independent and identically distributed random variables distributed according to the distributions $P_1$ and $P_2$ and wishes to decide whether $P_1=P_2$ (null hypothesis) or $P_1\neq P_2$ (alternative hypothesis). The Gutman test for this problem compares the empirical distributions of the observed sequences and decides on the null hypothesis if the Jensen-Shannon (JS) divergence between these empirical distributions is below a given threshold. This paper proposes a generalization of the Gutman test, termed \emph{divergence test}, which replaces the JS divergence by an arbitrary divergence. For this test, the exponential decay of the type-II error probability for a fixed type-I error probability is studied. First, it is shown that the divergence test achieves the optimal first-order exponent, irrespective of the choice of divergence. Second, it is demonstrated that divergence tests with invariant divergences achieve the same second-order asymptotics as the Gutman test. In addition, a connection between two-sample testing and robust goodness-of-fit testing is established.
Fields of Study & Subjects
Random Matrices and Applications
Distributed Sensor Networks and Detection Algorithms
Statistical Distribution Estimation and Applications
Publication details
- Journal / source
- 2026 IEEE International Symposium on Information Theory (ISIT)
- Publisher
- IEEE
- Pages
- 1–6
- Publication date
- 1 June 2026