Exponentially Consistent Low Complexity Test for Sequential Outlier Hypothesis Testing

2026 IEEE International Symposium on Information Theory (ISIT) 2026

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Authors: Jun Diao, Jingjing Wang, Lin Zhou
DOI: 10.1109/isit62367.2026.11653881
Cited by: 1
References: 22

Publication details

Journal / source
2026 IEEE International Symposium on Information Theory (ISIT)
Publisher
IEEE
Pages
1–6
Publication date
1 June 2026