10.8 COBI: A Degree-of-56 Column-Bipartite Densely Connected Digital Ising Chip with 8b Spin Coefficients
Abstract
We present a 65nm digital Ising chip with an advanced column-bipartite topology, featuring densely connected spins with a degree of 56 and 8b coefficients for mapping and solving computationally intensive combinatorial optimization problems. A fabricated Ising test chip with 64 spin processing elements with spin coefficients stored in flexible embedded SRAM demonstrates solving practical problems, such as MIMO detection for a wireless network, with a fast solution time (
Fields of Study & Subjects
Quantum-Dot Cellular Automata
Quantum Computing Algorithms and Architecture
Cellular Automata and Applications
Publication details
- Journal / source
- 2026 IEEE International Solid-State Circuits Conference (ISSCC)
- Publisher
- IEEE
- Pages
- 182–184
- Publication date
- 15 February 2026