Multi-Frequency Impedance Measurement for Equivalent Parameter Identification in Through-Metal IPT Systems

IEEE Journal of Emerging and Selected Topics in Power Electronics 2026

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Authors: Shuai Chen, Jiaqi Tu, Zheng Li, Wei Zhou, Ruikun Mai, Zhengyou He, Yang Chen
DOI: 10.1109/jestpe.2026.3719939
Cited by: 1

Fields of Study & Subjects

Microwave and Dielectric Measurement Techniques Advanced Power Amplifier Design Electrical Contact Performance and Analysis

Publication details

Journal / source
IEEE Journal of Emerging and Selected Topics in Power Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Pages
1–1
Publication date
1 January 2026