Irreversible Membrane Deformation and Other Defects in Silicon-on-Nothing Structures: Experimental Insights and Cavity Pressure Characterization
Fields of Study & Subjects
Structural Analysis and Optimization
Advanced MEMS and NEMS Technologies
Space Satellite Systems and Control
Publication details
- Journal / source
- Journal of Microelectromechanical Systems
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 35
- Issue
- 3
- Pages
- 450–456
- Publication date
- 1 May 2026