Numerical Analysis of Localized Electric Field Enhancement in Apertureless Near Field Optical Microscopy

IEEE photonics journal 2026 Open access

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Authors: Ayushman Ramola, Amit Kumar Shakya, Yarden Mazor, Nezah Balal, Arik Bergman
DOI: 10.1109/jphot.2026.3656404
Cited by: 29
References: 34

Fields of Study & Subjects

Near-Field Optical Microscopy Integrated Circuits and Semiconductor Failure Analysis Optical Coatings and Gratings

Publication details

Journal / source
IEEE photonics journal
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
18
Issue
2
Pages
1–10
Publication date
21 January 2026