A New UV Spot Test for Quality Control

IEEE Journal of Photovoltaics 2026

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Authors: Ingrid R. Repins, Steve W. Johnston, Timothy J. Silverman, Elizabeth Palmiotti, Michael G. Deceglie, E. Ashley Gaulding
DOI: 10.1109/jphotov.2026.3663680
Cited by: 0

Abstract

We present a fast, low-cost ultraviolet (UV) spot test to screen photovoltaic modules for UV-induced degradation (UVID). The measurement is based on a fiber-coupled arc lamp that delivers a highly accelerated local UV dose—approximately five years of equivalent field exposure in less than a day. Spot-exposed areas are evaluated using electroluminescence imaging. We test a “known bad” product, which was observed to experience UVID in the field, and a “known good” product which did not exhibit UVID in the field. Results indicate that the method may be useful as a quick and relatively inexpensive quality control screening tool for customers and manufacturers.

Fields of Study & Subjects

Silicon and Solar Cell Technologies Photovoltaic System Optimization Techniques Photovoltaic Systems and Sustainability

Publication details

Journal / source
IEEE Journal of Photovoltaics
Volume
16
Issue
4
Pages
458–464
Publication date
4 March 2026
Language
EN