Optical Chopper Frequency Dependent Performance of Perovskite Optoelectronic Devices

Perovskite optoelectronic devices require characterization under chopped light illumination to accurately evaluate their performance metrics, including external quantum efficiency (EQE), responsivity (R), and detectivity (D*). We demonstrate that these parameters exhibit strong dependence on the chopping frequency, necessitating frequency optimization for reliable device performance assessment and operation. Through systematic characterization across a broad frequency range, we observe a capacitive-like response in the perovskite layer, which governs the frequency-dependent behavior of EQE and R. We propose a mathematical model to fit this response, enabling predictive performance analysis and explain the underlying physics by examining the impedance data. This work provides critical insights into frequency-resolved characterization protocols for perovskite optoelectronic devices, offering a framework to standardize performance evaluation and guide its optimization in presence of device limitations.