EMAT-Enhanced Synthetic Aperture Imaging With Phase-Sensitive Dual-Mode Signal Processing for Defect Characterization in Nondestructive Testing
Abstract
To enhance the accuracy of electromagnetic ultrasonic defect imaging, this study proposes a dual-wave defect signal phase feature recognition (DDFR) algorithm based on a sandwich-structured dual-wave electromagnetic acoustic transducer (EMAT). The algorithm integrates amplitude and phase information from longitudinal and shear waves to achieve precise extraction of defect signals. The dual-wave EMAT employs a sandwich structure design, with its beam focusing capability and detection sensitivity improved through multiphysics coupling analysis and Nelder-Mead algorithm-based parameter optimization. Four defects were detected using the dual-wave EMAT, and the acquired signals were processed using the DDFR algorithm. Imaging was performed via a simplified delay-and-sum synthetic aperture imaging. Results demonstrate that the study effectively identifies and locates all four defects, with a positioning error of less than 1 mm. This study provides an effective imaging solution for electromagnetic ultrasonic defect detection and imaging.
Fields of Study & Subjects
Ultrasonics and Acoustic Wave Propagation
Non-Destructive Testing Techniques
Electrical and Bioimpedance Tomography
Publication details
- Journal / source
- IEEE Sensors Journal
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 26
- Issue
- 4
- Pages
- 5682–5696
- Publication date
- 12 January 2026