Physics of Failure Transfer Learning for Aerospace Electronic Component Considering Manufacturing Parameter

IEEE Sensors Journal 2026

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Authors: Xuerong Ye, Zijian Guo, Hao Chen, Zhigang Sun, Guofu Zhai

DOI: 10.1109/jsen.2026.3653999

Cited by: 1

References: 27

Fields of Study & Subjects

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis Advancements in Semiconductor Devices and Circuit Design

References 27