A Modular Ring-Oscillator Array Chip for Accurate Stress Testing of CMOS Aging Mechanisms

IEEE Journal of Solid-State Circuits 2026 Open access

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Authors: Javier Diaz-Fortuny, E. Bury, Robin Degraeve, Ben Kaczer
DOI: 10.1109/jssc.2026.3653472
Cited by: 1
References: 71

Fields of Study & Subjects

Semiconductor materials and devices VLSI and Analog Circuit Testing Electrostatic Discharge in Electronics

Publication details

Journal / source
IEEE Journal of Solid-State Circuits
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
61
Issue
8
Pages
4359–4371
Publication date
6 February 2026
Language
EN