A Physics-Guided Diffusion Unmixing Model for Global Lunar Mineral Abundance Mapping

Read full text
Authors: Pan Zheng, Hongjun Su, Zhaoyue Wu, Juan M. Haut, Mercedes Eugenia Paoletti
Cited by: 1
References: 71

Abstract

Accurate global mapping of lunar regolith minerals is critical for understanding the geological evolution and resource potential of the Moon. However, spectral unmixing algorithms originally designed for terrestrial remote sensing often perform poorly when applied to the Moon, due to the nonlinear intimate mixing and spectral variability associated with its unique surface environment. To address these challenges, this study proposes a novel physics-guided radiative transfer model with a deep diffusion network, informed by spectral library prior, to estimate lunar mineral abundances from Chang'E-1 Interferometric Imaging Spectrometer (IIM) hyperspectral data. Single-scattering albedo (SSA) is retrieved by inverting the Hapke model, with photometric normalization to deal with multiple-scattering effects, observation geometry, and macroscopic roughness to mitigate extrinsic effects prior to unmixing. A physics-guided spectral library is constructed to capture intrinsic endmember variability arising from mineralogy and grain size. Spectral unmixing is then performed in the SSA domain using a diffusion model coupled with Bayesian abundance estimation. Validation against lunar sample data and 19 verified lunar sites confirms the accuracy of the proposed method. Global abundance maps for plagioclase, glass, orthopyroxene, olivine, ilmenite, and clinopyroxene exhibit improved spatial detail and better geological coherence compared to previous methods. These results validate the proposed method as a robust approach for global-scale lunar mineral mapping, with strong potential for integration into future planetary remote sensing missions.

Fields of Study & Subjects

Planetary Science and Exploration Geochemistry and Geologic Mapping Remote Sensing in Agriculture

Publication details

Journal / source
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
19
Pages
7320–7340
Publication date
1 January 2026
Language
EN