Super-Resolution of Remote Sensing Images via the Parallel Lattice Attention Network

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Authors: Allen Patnaik, Arpit Gour, M. K. Bhuyan, Karl Fredric MacDorman, Sultan Alfarhood, Mejdl Safran
Cited by: 1
References: 54

Abstract

Deep learning-based super-resolution models often struggle to balance capturing long-range dependencies with computational efficiency, as convolutional neural networks focus on local features while transformers incur high computational costs. To address this trade-off, we propose a parallel lattice attention network (PLAN) to improve the reconstruction of complex features. Unlike traditional lattice networks that rely on sequential cascading, PLAN introduces a parallel lattice attention block that splits the input feature map into concurrent branches. These branches employ lattice attention units to simultaneously extract fine-grained details and global context, which are subsequently fused via attention-based integration. This parallel design maximizes computational efficiency while ensuring robust reuse of features. Experiments on the AID, UC Merced, and WHU-RS19 datasets at various scales show PLAN's superiority in focusing on critical information to enhance image quality. On the UC Merced dataset with a$2 \times$scaling factor, PLAN achieves a PSNR of 32.12 dB and an SSIM of 0.8807, outperforming state-of-the-art methods such as ESTNet and BMFENet by at least 0.07 dB in PSNR and 0.0210 in SSIM. On the WHU-RS19 dataset with a$4 \times$scaling factor, PLAN achieves a PSNR of 29.16 dB and an SSIM of 0.7597, surpassing previous methods by up to 0.64 dB in PSNR. PLAN also maintains computational efficiency with a runtime of 30.97 ms, faster performance than ESRT (106.34 ms), SwinIR (98.47 ms), FENet (63.52 ms), OmniSR (45.02 ms), BMFENet (51.43 ms), MSCT (57.15 ms), and ESTNet (67.95 ms).

Fields of Study & Subjects

Advanced Image Processing Techniques Advanced Image Fusion Techniques Sparse and Compressive Sensing Techniques

Publication details

Journal / source
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
19
Pages
6067–6078
Publication date
1 January 2026