Crystalline IGO TFTs With High Reliability Under DRAM-Compatible 600 °C N 2 Thermal Budgets

IEEE Electron Device Letters 2026

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Authors: Jeong Eun Oh, Nahyun Kim, Jiwon Chae, Min Hee Cho, Daewon Ha, Jae Kyeong Jeong
DOI: 10.1109/led.2026.3675621
Cited by: 2
References: 24

Fields of Study & Subjects

Thin-Film Transistor Technologies Transition Metal Oxide Nanomaterials Advanced Sensor and Energy Harvesting Materials

Publication details

Journal / source
IEEE Electron Device Letters
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
47
Issue
5
Pages
925–928
Publication date
19 March 2026