Ta-Sb-Te Phase Change Memory Device With Reduced Multilevel Resistance Drift for Deep Neural Network Applications
Fields of Study & Subjects
Phase-change materials and chalcogenides
Advanced Memory and Neural Computing
Chemical and Physical Properties of Materials
Publication details
- Journal / source
- IEEE Electron Device Letters
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 47
- Issue
- 6
- Pages
- 1121–1124
- Publication date
- 30 April 2026