2.3-kV Vertical GaN Trench MOSFET with Variable Lateral Ion-implanted Guard Rings
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Pulsed Power Technology Applications
Silicon Carbide Semiconductor Technologies
Publication details
- Journal / source
- IEEE Electron Device Letters
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 47
- Issue
- 10
- Pages
- 1–1
- Publication date
- 1 January 2026