Merged-Reference-Compatible Offset-Canceling Discharge-Based Sensing Circuit for STT-MRAM in 28-nm CMOS

IEEE Solid-State Circuits Letters 2026

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Authors: Jae Won Jang, 한민구, Jaehwan Kim, Taehui Na

DOI: 10.1109/lssc.2026.3715234

Cited by: 1

References: 14

Fields of Study & Subjects

Electrostatic Discharge in Electronics Analytical Chemistry and Sensors Advancements in Semiconductor Devices and Circuit Design

References 14