SBCCI 2024

IEEE Design and Test 2026

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Authors: José Augusto M. Nacif, OMAR PARANAIBA VILELA NETO
DOI: 10.1109/mdat.2025.3649400
Cited by: 0

Fields of Study & Subjects

VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis VLSI and FPGA Design Techniques

Publication details

Journal / source
IEEE Design and Test
Volume
43
Issue
2
Pages
5–6
Publication date
25 February 2026
Language
EN