Mutual Information-Driven Visualization and Clustering for Core KPI Selection in O-RAN Testing

IEEE Wireless Communications 2026

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Authors: Anish Pradhan, Lingjia Liu, Harpreet S. Dhillon
DOI: 10.1109/mwc.2026.3655251
Cited by: 1

Fields of Study & Subjects

Advanced Neural Network Applications Engineering and Test Systems Software System Performance and Reliability

Publication details

Journal / source
IEEE Wireless Communications
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Pages
1–8
Publication date
1 January 2026