Mapping and Tracking Conductivity in Memristive Nanowire Networks With Electrical Resistance Tomography
Abstract
In recent years, Electrical Resistance Tomography (ERT) has been successfully applied to map the conductivity of thin-film materials and graphene. Beyond the mapping of static conductivity distribution, ERT is proposed as a new valuable tool for the characterisation of memristive materials that present a dynamic behaviour, where the conductivity evolves over time depending on the external stimulation. In this work, we show that ERT can provide insight into both the conductivity distribution and its time-evolution in memristive metallic nanowire networks, enabling visualization of induced conductive traces in samples potentiated by means of the ERT setup itself.
Fields of Study & Subjects
Advanced Memory and Neural Computing
Electrochemical Analysis and Applications
Ferroelectric and Negative Capacitance Devices
Publication details
- Journal / source
- IEEE Open Journal of Instrumentation and Measurement
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Volume
- 5
- Pages
- 6000109–6000109
- Publication date
- 1 January 2026
- Language
- EN