HieraTest: Hierarchical Dependency-Driven Framework with Multi-Strategy Repair for LLM-Based Unit Test Generation
Fields of Study & Subjects
Software Testing and Debugging Techniques
Engineering and Test Systems
VLSI and Analog Circuit Testing
Publication details
- Journal / source
- 2026 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)
- Publisher
- IEEE
- Pages
- 1–12
- Publication date
- 17 March 2026