Low-Delay, High-Robustness DNU Self-Healing Latch Based on the C-Element Feedback Loop

As the impact of various radiations in the space environment on the reliability of latch circuits increases, this paper proposes a low-delay double node upset (DNU) self-healing latch (LDDSL). The LDDSL latch is implemented based on a C-element (CE) feedback loop, enabling all internal node pairs to undergo DNU self-healing. The incorporation of high-speed channels between inputs and outputs significantly reduces delay time. The LDDSL latch achieves the lowest delay compared to existing latches with DNU-hardening, in terms of 15.59% less power consumption, a reduced 42.61% delay, and a remarkable 38.11% reduction in PDAP. Furthermore, the LDDSL latch demonstrates lower or comparable sensitivity to process, voltage, and temperature (PVT) variations when compared to the reference latch designs.