Toward Practical Emotion Recognition: An Unsupervised Source-Free Approach for EEG Domain Adaptation

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Authors: Md Niaz Imtiaz, Naimul Khan
Cited by: 1
References: 61

Abstract

Emotion recognition is crucial for advancing mental health, healthcare, and technologies such as brain-computer interfaces. EEG-based models, however, struggle in cross-domain settings due to the high cost of labeled data and signal variability across individuals and recording conditions. Unsupervised domain adaptation typically requires access to source data, which is often infeasible because of privacy and computational constraints. Source-free unsupervised domain adaptation (SF-UDA) removes this requirement, but it has not yet been applied to emotion recognition. We propose an SF-UDA approach for cross-domain EEG emotion classification, built on a multi-stage framework that adapts to the target domain without source data. Dual-Loss Adaptive Regularization (DLAR) minimizes prediction discrepancies on confident samples and aligns predictions with expected pseudo-labels. Localized Consistency Learning (LCL) enforces local consistency by promoting similar predictions among reliable neighbors. Together, these components address domain shift and reduce the impact of noisy pseudo-labels, a key challenge in SF-UDA. Experiments on DEAP, SEED, and DREAMER show that our method significantly outperforms state-of-the-art approaches, reaching 65.84% and 58.87% accuracy on SEED and DREAMER when trained on DEAP, and 58.99% and 67.08% on DEAP and DREAMER when trained on SEED. It detects both positive and negative emotions well, making it suitable for practical emotion recognition applications. Code available at: https://github.com/RyersonMultimediaLab/EmotionRecognitionSF-UDA

Fields of Study & Subjects

Emotion and Mood Recognition EEG and Brain-Computer Interfaces Domain Adaptation and Few-Shot Learning

Publication details

Journal / source
IEEE Transactions on Affective Computing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
17
Issue
3
Pages
3506–3520
Publication date
1 July 2026
Language
EN