Optimization of High-Quality YBCO Thin Films Deposited by PLD as a Function of Thickness

Pulsed Laser Deposition (PLD) offers a powerful route for the fabrication of high-quality YBCO films with exceptional crystallographic alignment. In this study, the influence of film thickness on the corresponding electrical properties was investigated, with a particular emphasis on their correlation with microstructural features. Transport measurements indicate that the critical current density (Jc) shows a progressive decline as the film thickness increases, a phenomenon that can be directly related to the microstructural characteristics observed. These findings provide valuable insight into the inherent challenges associated with growing thick films and may guide future strategies for optimizing their properties in high-field applications. Furthermore, understanding these mechanisms is crucial for advancing the design and performance of high-temperature superconducting magnets and other electronic devices that require thick, high-performance films.