Time-Division Multiplexing Switching Transients and Bandwidth Effects on the X-Ray Integral Field Unit Readout Performance

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Authors: Edoardo Cucchetti, Hervé Geoffray, Sophie Beaumont, William Bertrand Doriese, M. S. Durkin, Christian Kirsch, R. Denis-Jung, O. Maisonnave, Aymeric Panglosse, Philippe Peille, Kazuhiro Sakai, S. J. Smith
+1 more Nicholas A. Wakeham
Cited by: 0
References: 14

Abstract

The X-IFU (X-ray Integral Field Unit), on the future European X-ray observatoryNewAthena, will perform high-resolution imaging spectroscopy over an array of 1,504 transition-edge sensors operated at 55 mK. Its readout is performed via time-division multiplexing (TDM) at a few MHz, which relies on fast (but not instantaneous) switching between pixels of the same column. Differences in the currents of consecutive rows lead to signal-dependent transients in the readout. These transients, and how they settle before sampling of the final row signal, are in turn governed by the open-loop bandwidths in the system. Limitations of the bandwidths smear the transients and contaminate the settling of photon pulses, resulting in a frequency- and amplitude-dependent error on the output signal. Switching transients have thus ultimately a direct impact on the instrument's energy scale. Although the origin of these perturbations is well-understood, quantifying their end-to-end impact on performance remains challenging. We compare here experimental data with simulations to assess the accuracy of numerical predictions. We also present an end-to-end analysis of nonlinearity in the X-IFU energy scale due to switching transients, and compare it against current performance budget allocations. These simulations show that the X-IFU can meet its energy scale requirements.

Fields of Study & Subjects

Superconducting and THz Device Technology Particle Detector Development and Performance Astronomy and Astrophysical Research

Publication details

Journal / source
IEEE Transactions on Applied Superconductivity
Volume
36
Issue
6
Pages
1–6
Publication date
13 February 2026
Language
EN