A Survey on Deep Learning for Face Anti-Spoofing in Automotive Applications

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Authors: Michael Ruiz, Hossein Hassani, Soodeh Nikan
Cited by: 1
References: 163

Abstract

Facial recognition (FR) is increasingly deployed in vehicles for authentication and personalized user settings. However, these systems are vulnerable to sophisticated spoofing attacks, necessitating robust face anti-spoofing (FAS) solutions. Deep learning (DL)-based FAS has achieved strong results in general settings, but its adaptation to in-vehicle environments faces distinct challenges, including dynamic lighting, frequent occlusions, and limited onboard computational resources. Although there is extensive research on general FAS, its application and performance within in-vehicle environments remain underexplored. This paper reviews the state of the art DL-based FAS methods and evaluates their applicability to automotive contexts. The survey covers a detailed taxonomy of traditional and advanced approaches, including Convolutional Neural Networks (CNNs), Vision Transformers (ViT), generative models, multimodal and spatiotemporal frameworks, adversarially robust techniques, and data-efficient paradigms. The paper also outlines evaluation metrics, cross-dataset protocols, and publicly available datasets, highlighting the scarcity of realistic in-vehicle benchmarks. Finally, we discuss deployment challenges unique to vehicular settings and identify future directions such as domain-adaptive learning, synthetic and simulation-based data generation, and multimodal large language models. By bridging current methods with the specific demands of vehicles, this survey provides a foundation for developing secure, lightweight, and explainable FAS mechanisms suitable for deployment on intelligent vehicle systems.

Fields of Study & Subjects

Biometric Identification and Security Face recognition and analysis Advanced Malware Detection Techniques

Publication details

Journal / source
IEEE Transactions on Biometrics Behavior and Identity Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Volume
8
Issue
4
Pages
497–517
Publication date
27 February 2026